Thin film circuit automatic resistance testing machines usually support a variety of different test modes to meet the testing needs of different types of thin film circuits.
First of all, the common test mode is the spot test mode. In spot measurement mode, the resistance tester uses a probe or probe to spot different locations on the thin film circuit to measure the resistance value. This is the most basic test mode.
Secondly, thin film circuit automatic resistance testing machines generally support linear scan mode. The linear scan mode can scan the entire thin film circuit within a certain range and gradually measure the resistance value on it. This provides a more complete understanding of the overall resistance distribution of thin film circuits.
In addition, some advanced thin film circuit automatic resistance testing machines may also support multi-point measurement mode. Multi-point measurement mode is used to measure resistance values at multiple locations on thin film circuits simultaneously to improve testing efficiency and accuracy.
In addition, some thin film circuit automatic resistance testing machines may also support more special test modes, such as voltage detection mode, frequency sweep mode, etc. These modes can be selected according to specific testing needs to meet the special testing requirements of different types of thin film circuits.
It should be noted that different thin film circuit automatic resistance testing machines have different functions and features, and the supported test modes may also be different. Therefore, when selecting and using equipment, it is recommended to refer to the equipment manual or consult the equipment supplier to understand its specific test modes and functions.
